Fast relaxation of stresses in solid oxide cells through reduction. Part I: Macro-stresses in the cell layers

To assess the risk of failure various components in solid oxide cell (SOC) stacks, temporal evolution stresses from sintering and thermal gradients operating stacks must be known. In this work it is shown experimentally that residual a are relaxed and, most cases, go to zero at point chemical reduction structurally dominant fuel electrode NiO-YSZ Ni-YSZ. This essential for understanding modeling during SOC stack assembly after. part I, in-plane macro-strain each layer determined by in-situ X-ray diffraction different temperatures reduction. The also analyzed multilayer model cell. relaxation explained attributed so-called accelerated creep occurring nickel phase electrode.